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|Title: ||Comparison of Impedance Measurements in a DSP using Ellipse-fit and Seven-Parameter Sine-fit Algorithms|
|Authors: ||Ramos, Pedro M.|
Janeiro, Fernando M.
|Keywords: ||Impedance measurements|
Digital signal processor
DSP based instrument
Experimental uncertainty analysis
|Issue Date: ||Nov-2009|
|Abstract: ||In this paper, two DSP implemented algorithms for impedance measurements are compared.
Previously published results demonstrate the usefulness of sine-fit algorithms and
ellipse-fit algorithms for impedance measurements where two channels are simultaneously
acquired with analog to digital converters. The comparison between the two
implemented algorithms is done by analyzing the average execution time, memory
requirements and experimental standard deviation of the estimated impedance parameters.
For the first time, the seven-parameter sine-fit algorithm is adapted so that it does not
need the construction and manipulation of its largest matrix thus requiring less overall
memory. This improvement can be used to acquire and process more samples (leading
to reduced experimental standard deviations of the estimated parameters) with the same
|Appears in Collections:||CEM - Publicações - Artigos em Revistas Internacionais Com Arbitragem Científica|
FIS - Publicações - Artigos em Revistas Internacionais Com Arbitragem Científica
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