Please use this identifier to cite or link to this item: http://hdl.handle.net/10174/9619

Title: Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
Authors: Rosado, Luis
Janeiro, Fernando M.
Ramos, Pedro M.
Piedade, Moisés
Keywords: Artificial neural networks (ANNs)
defect parameter estimation
eddy current testing (ECT)
feature extraction
nonlinear regression
Issue Date: May-2013
Publisher: IEEE Transactions in Instrumentation and Measurement
Citation: Rosado, L.S.; Janeiro, F.M.; Ramos, P.M.; Piedade, M., "Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks," Instrumentation and Measurement, IEEE Transactions on , vol.62, no.5, pp.1207,1214, May 2013
Abstract: The estimation of the parameters of defects from eddy current nondestructive testing data is an important tool to evaluate the structural integrity of critical metallic parts. In recent years, several works have reported the use of artificial neural networks (ANNs) to deal with the complex relation between the testing data and the defect properties. To extract relevant features used by the ANN, principal component analysis, wavelet decomposition, and the discrete Fourier transform have been proposed. In this paper, a method to estimate dimensional parameters from eddy current testing data is reported. Feature extraction is based on the modeling of the testing data by a template of additive Gaussian functions and nonlinear regressions to estimate their parameters. An ANN was trained using features extracted from a synthetic data set obtained with finite-element modeling of the eddy current probe. The proposed method was applied to both simulated and measured data, providing good estimates.
URI: http://hdl.handle.net/10174/9619
Type: article
Appears in Collections:FIS - Publicações - Artigos em Revistas Internacionais Com Arbitragem Científica
CEM - Publicações - Artigos em Revistas Internacionais Com Arbitragem Científica

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