Please use this identifier to cite or link to this item:
http://hdl.handle.net/10174/5414
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Title: | Eddy Currents Testing Defect Characterization based on Non-Linear Regressions and Artificial Neural Networks |
Authors: | Rosado, Luis Ramos, Pedro M. Janeiro, Fernando M. Piedade, Moisés |
Keywords: | Eddy Current Testing Non-Linear Regression Feature Extraction Defect Parameter Estimation |
Issue Date: | May-2012 |
Publisher: | I2MTC |
Abstract: | Feature extraction and defect parameters estimation
from eddy current testing data has received special attention in
the last years. Principal component analysis, wavelet
decomposition and Fourier descriptors are some of the tools used
for feature extraction. Particular interest is devoted to using
artificial neural networks to perform parameters estimation and
profile reconstruction of defects. This work reports the use of
non-linear regressions for feature extraction based on the
modeling of the measured response by a set of additive Gaussians
and artificial neural networks to estimate the width and depth of
defects. |
URI: | http://hdl.handle.net/10174/5414 |
Type: | lecture |
Appears in Collections: | FIS - Comunicações - Em Congressos Científicos Internacionais CEM - Comunicações - Em Congressos Científicos Internacionais
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