Repositório Digital de Publicações Científicas: Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms

Please use this identifier to cite or link to this item: http://hdl.handle.net/10174/1428

Title:	Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms
Authors:	Ramos, Pedro M. Janeiro, Fernando M. Tlemçani, Mouhaydine Serra, António C.
Keywords:	Impedance measurements Ellipse fitting algorithm Digital signal processor
Issue Date:	Sep-2007
Abstract:	In this paper, the DSP implementation of an impedance measurement instrument based on ellipse fitting algorithms is described. The system prototype is based on a commercial DSP kit with few external electronics for baseline assessment and requirements definition. The implemented system is tested for impedance magnitudes from 100 Ω up to 15 kΩ, phases in the ±90º range at 1 kHz measuring frequency with extremely good results.
URI:	http://hdl.handle.net/10174/1428
Type:	lecture
Appears in Collections:	CEM - Comunicações - Em Congressos Científicos Internacionais CGE - Comunicações - Em Congressos Científicos Internacionais FIS - Comunicações - Em Congressos Científicos Internacionais

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File	Description	Size	Format
16. IMEKO TC4 2007.pdf	Final	147.23 kB	Adobe PDF	View/Open