Please use this identifier to cite or link to this item:
http://hdl.handle.net/10174/10600
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| Title: | Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist samplig |
| Authors: | Tlemcani, M.
André, Albino
Hugo, G. Silva
Mourad, Bezzeghoud |
| Editors: | Prof. Dr. SANZ-BOBI, MIGUEL A.
Prof. Dr. COLAK, ILHAMI
Prof. Dr. KUROKAWA, FUJIO |
| Keywords: | capacitors
ADC
ellipse fitting |
| Issue Date: | 23-Oct-2013 |
| Publisher: | ICRERA 2013 |
| Citation: | M. Tlemcani, A. Albino, H.G:Silva, M. Bezzeghoud. Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist sampling. ICREA 2013 |
| Abstract: | Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum. |
| URI: | http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=31662
http://hdl.handle.net/10174/10600 |
| Type: | article |
| Appears in Collections: | CGE - Artigos em Livros de Actas/Proceedings
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